Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11067658 | Probe card inspection wafer, probe card inspection system, and method of inspecting probe card | Joon-Su Ji, Han-jik Nam, Jin Woo Jung | 2021-07-20 |
DK
Dany Kim
Overall (2021): #483,402 of 548,734Top 90%
1
Patents 2021