Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11002761 | Probe card system for testing an integrated circuit | Vladimir V. Genkin, Joseph A. Peters | 2021-05-11 |
| 10962585 | Gate charge measurements using two source measure units | Mary Anne Tupta | 2021-03-30 |