Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11181361 | Optical measurement method, optical measurement device, optical measurement program, and recording medium for recording optical measurement program | Kazuhiro Hotta | 2021-11-23 |
| 10955458 | Semiconductor device inspection apparatus and semiconductor device inspection method | Toru Matsumoto | 2021-03-23 |
| 10923404 | Inspection method, inspection device, and marking forming method | Shinsuke Suzuki | 2021-02-16 |