Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 11105854 | System, apparatus and method for inter-die functional testing of an integrated circuit | Lakshminarayana Pappu, Robert P. Adler | 2021-08-31 | $22,590,000 |