Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125805 | Device for measuring surface characteristics of a material | Umberto Celano, Wilfried Vandervorst | 2021-09-21 |
| 11112427 | Method and tip substrate for scanning probe microscopy | Thomas Hantschel, Hugo Bender, Antti Kanniainen | 2021-09-07 |