Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11002763 | Probe for pic die with related test assembly and method | Ye Wang, Hanyi Ding | 2021-05-11 |
| 10949005 | Absolute phase measurement testing device and technique | Mustapha Slamani, Kaushal Kannan, Ritin Nambiar | 2021-03-16 |