Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11131706 | Degradation monitoring of semiconductor chips | — | 2021-09-28 |
| 11105856 | Detection of performance degradation in integrated circuits | Emily A. Ray, Emmanuel Yashchin, Peilin Song, Kevin G. Stawiasz, Barry P. Linder +4 more | 2021-08-31 |
| 10901025 | Measuring individual device degradation in CMOS circuits | Barry P. Linder | 2021-01-26 |