YK

Yasuhiko Kaneko

FU Fujifilm: 3 patents #130 of 731Top 20%
Overall (2021): #57,243 of 548,734Top 15%
3
Patents 2021

Issued Patents 2021

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11156567 Defect inspection apparatus, method, and program — 2021-10-26
11029255 Defect inspection device, defect inspection method, and program — 2021-06-08
10989672 Defect inspection device, defect inspection method, and program — 2021-04-27