Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10942025 | Measurement method for micro topography and roughness of internal surface of gap | Jiang Guo, Shujie Liu, Renke KANG | 2021-03-09 |
| 10942099 | Self-healing method for fractured SiC single crystal nanowires | Zhenyu Zhang, Junfeng Cui, Yuefeng Du | 2021-03-09 |