Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11144701 | System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environment | William J. Egan, David M. Fried, Anshuman Kunwar | 2021-10-12 |
| 11074388 | System and method for predictive 3-D virtual fabrication | Stephen R. Breit, David M. Fried, Daniel Faken | 2021-07-27 |
| 11048847 | System and method for performing a multi-etch process using material-specific behavioral parameters in a 3-D virtual fabrication environment | Daniel Faken, David M. Fried, Stephen R. Breit | 2021-06-29 |