WL

Wei Li

NC National Institute Of Metrology, China: 1 patents #1 of 3Top 35%
📍 Shanghai, CA: #266 of 431 inventorsTop 65%
Overall (2021): #215,435 of 548,734Top 40%
1
Patents 2021

Issued Patents 2021

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11156636 Scanning probe having micro-tip, method and apparatus for manufacturing the same Zhen-Dong Zhu, Si Gao 2021-10-26