Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11029330 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Sergey Osechinskiy, Bede Pittenger, Syed-Asif Syed-Amanulla | 2021-06-08 |
| 10900997 | Low drift system for a metrology instrument | Andrew Neushul | 2021-01-26 |