Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125704 | Measurement system, program, and measurement system control method | Yu Aoki, Tatsuya Inoue, Seiji Fujimura | 2021-09-21 |
| 10948438 | X-ray fluorescence analysis system | Seiitsu Kurita | 2021-03-16 |