Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060981 | Guided inspection of a semiconductor wafer based on spatial density analysis | Ariel Hirszhorn | 2021-07-13 |
| 10937706 | Method of examining defects in a semiconductor specimen and system thereof | Ariel Hirszhorn | 2021-03-02 |