Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11177048 | Method and system for evaluating objects | Igor Krivts (Krayvitz), Efim Vinnitsky, Yoram Uziel, Ron Naftali | 2021-11-16 |
| 11047677 | X-ray based metrology of a high aspect ratio hole | — | 2021-06-29 |