Mei-Mei Su — 5 Patents at Advantest

Issued Patents 2021

Showing 1–5 of 5 patents

Patent #	Title	Co-Inventors	Date
11099228	Test system and method	—	2021-08-24
11041907	Method and system for acquisition of test data	Ben Rogel-Favila, John K. Frediani, Shunji Tachibana	2021-06-22
11009550	Test architecture with an FPGA based test board to simulate a DUT or end-point	Duane Champoux	2021-05-18
11002787	Scalable platform for system level testing	Roland Wolff, Ben Rogel-Favila	2021-05-11
10929260	Traffic capture and debugging tools for identifying root causes of device failure during automated testing	Linden Hsu, Ben Rogel-Favila, Michael Jones, Duane Champoux	2021-02-23