Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861970 | Semiconductor epitaxial structure with reduced defects | Chun-Ming Chang, Wen-Jung Liao, Ming-Chang Lu | 2020-12-08 |
| 10776402 | Manufacture parameters grouping and analyzing method, and manufacture parameters grouping and analyzing system | Li-Chin Wang, Ya-Ching Cheng, Chien-Hung Chen, Da-Ching Liao | 2020-09-15 |
| 10762618 | Mask weak pattern recognition apparatus and mask weak pattern recognition method | Pin-Yen Tsai, Hsu-Tang Liu, Yi-Jung Chang | 2020-09-01 |