Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10725385 | Optimizing the utilization of metrology tools | Tsachy Holovinger, Liran Yerushalmi, David Tien | 2020-07-28 |
| 10649447 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Pavel Izikson, John Robinson, Mike Adel, Amir Widmann, Anat Marchelli | 2020-05-12 |