Issued Patents 2020
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10867225 | Measurement system and measurement method | Toyoo Iida, Hitoshi Nakatsuka | 2020-12-15 |
| 10859506 | Image processing system for processing image data generated in different light emission states, non-transitory computer readable recording medium, and image processing method | — | 2020-12-08 |
| 10863069 | Image processing system and setting method | Jaewook HWANG, Shingo Inazumi | 2020-12-08 |
| 10861179 | Image inspecting apparatus, image inspecting method and image inspecting program | — | 2020-12-08 |
| 10853935 | Image processing system, computer readable recording medium, and image processing method | — | 2020-12-01 |
| 10839538 | Image processing system | — | 2020-11-17 |
| 10827114 | Imaging system and setting device | Tomohiro ARANO | 2020-11-03 |
| 10761405 | Image inspection device and illumination device | — | 2020-09-01 |
| 10748020 | Controller and image processing system | Shingo Inazumi, Jaewook HWANG | 2020-08-18 |
| 10733355 | Information processing system that stores metrics information with edited form information, and related control method information processing apparatus, and storage medium | — | 2020-08-04 |