Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10768232 | ATE compatible high-efficient functional test | Jens Kuenzer, Cedric Lichtenau, Martin Padeffke | 2020-09-08 |
| 10746790 | Constrained pseudorandom test pattern for in-system logic built-in self-test | Alejandro Alberto Cook Lobo, Daniel Kiss, Jens Kuenzer | 2020-08-18 |
| 10684930 | Functional testing of high-speed serial links | Martin Eckert, Marta Junginger, Eckhard Kunigkeit, Matthias Pflanz, Quintino L. Trianni | 2020-06-16 |