Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10679909 | System, method and non-transitory computer readable medium for tuning sensitivies of, and determining a process window for, a modulated wafer | David Craig Oram, Abhinav Mathur, Eugene Shifrin | 2020-06-09 |
| 10572991 | System and method for aligning semiconductor device reference images and test images | Hong-Ching Chen, Michael Cook, Pavan Kumar | 2020-02-25 |