| 10854305 |
Using a status indicator in a memory sub-system to detect an event |
Michael G. Miller, Kishore Kumar Muchherla, Walter Di Francesco, Renato C. Padilla, Gary F. Besinga +1 more |
2020-12-01 |
| 10824527 |
Flash memory block retirement policy |
Giuseppe Cariello, Deping He, Scott Anthony Stoller, Devin M. Batutis, Preston A. Thomson |
2020-11-03 |
| 10818361 |
Preemptive idle time read scans |
Ashutosh Malshe, Kishore Kumar Muchherla, Michael G. Miller, Sampath K. Ratnam, Xu Zhang +1 more |
2020-10-27 |
| 10796745 |
Temperature informed memory refresh |
Gianni Stephen Alsasua, Kishore Kumar Muchherla, Sampath K. Ratnam, Ashutosh Malshe, Vamsi Pavan Rayaprolu +1 more |
2020-10-06 |
| 10789126 |
Multiple memory devices having parity protection |
Xiangang Luo, Preston A. Thomson, Michael G. McNeeley |
2020-09-29 |
| 10777284 |
Read voltage calibration based on host IO operations |
Ashutosh Malshe, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Kulachet Tanpairoj +1 more |
2020-09-15 |
| 10770156 |
Memory devices and methods for read disturb mitigation involving word line scans to detect localized read disturb effects and to determine error count in tracked sub sets of memory addresses |
Renato C. Padilla, Jung Sheng Hoei, Michael G. Miller, Roland J. Awusie, Sampath K. Ratnam +3 more |
2020-09-08 |
| 10761727 |
Scan frequency modulation based on memory density or block usage |
Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Ashutosh Malshe, Kishore Kumar Muchherla |
2020-09-01 |
| 10755793 |
SLC page read |
Scott Anthony Stoller, Jung Sheng Hoei, Ashutosh Malshe, Gianni Stephen Alsasua, Kishore Kumar Muchherla |
2020-08-25 |
| 10755792 |
Block read count voltage adjustment |
Kishore Kumar Muchherla, Gianni Stephen Alsasua, Ashutosh Malshe, Sampath K. Ratnam, Gary F. Besinga +1 more |
2020-08-25 |
| 10747612 |
Multi-page parity protection with power loss handling |
Kishore Kumar Muchherla, Xiangang Luo, Vamsi Pavan Rayaprolu, Ashutosh Malshe |
2020-08-18 |
| 10741224 |
NAND cell encoding to improve data integrity |
Tyson M. Stichka, Preston A. Thomson, Scott Anthony Stoller, Christopher Joseph Bueb, Jianmin Huang +1 more |
2020-08-11 |
| 10719271 |
Temperature correction in memory sub-systems |
Gianni Stephen Alsasua, Karl D. Schuh, Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu +2 more |
2020-07-21 |
| 10691377 |
Adjusting scan event thresholds to mitigate memory errors |
Gianni Stephen Alsasua, Peter Feeley, Ashutosh Malshe, Renato C. Padilla, Kishore Kumar Muchherla +1 more |
2020-06-23 |
| 10685731 |
Erase page check |
Ting Luo, Scott Anthony Stoller, Preston A. Thomson, Devin M. Batutis, Kulachet Tanpairoj |
2020-06-16 |
| 10679704 |
NAND temperature data management |
Kishore Kumar Muchherla, Sampath K. Ratnam, Preston A. Thomson, Jung Sheng Hoei, Peter Feeley +1 more |
2020-06-09 |
| 10672452 |
Temperature informed memory refresh |
Gianni Stephen Alsasua, Kishore Kumar Muchherla, Sampath K. Ratnam, Ashutosh Malshe, Vamsi Pavan Rayaprolu +1 more |
2020-06-02 |
| 10671298 |
Storing page write attributes |
Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Kishore Kumar Muchherla, Ashutosh Malshe, Gianni Stephen Alsasua |
2020-06-02 |
| 10658047 |
Implementing sticky read using error control success rate associated with a memory sub-system |
Kishore Kumar Muchherla, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Renato C. Padilla +1 more |
2020-05-19 |
| 10593412 |
Using a status indicator in a memory sub-system to detect an event |
Michael G. Miller, Kishore Kumar Muchherla, Walter Di Francesco, Renato C. Padilla, Gary F. Besinga +1 more |
2020-03-17 |
| 10586602 |
Read voltage calibration based on host IO operations |
Ashutosh Malshe, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Kulachet Tanpairoj +1 more |
2020-03-10 |
| 10579307 |
Correcting power loss in NAND memory devices |
Michael G. Miller, Kishore Kumar Muchherla, Sampath K. Ratnam, Renato C. Padilla, Gary F. Besinga +1 more |
2020-03-03 |
| 10573357 |
Optimized scan interval |
Kishore Kumar Muchherla, Ashutosh Malshe, Gianni Stephen Alsasua, Gary F. Besinga, Sampath K. Ratnam +1 more |
2020-02-25 |
| 10559369 |
Voltage degradation aware NAND array management |
Sebastien Andre Jean |
2020-02-11 |
| 10553290 |
Read disturb scan consolidation |
Kishore Kumar Muchherla, Ashutosh Malshe, Shane Nowell, Vamsi Pavan Rayaprolu, Sampath K. Ratnam |
2020-02-04 |
