Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852351 | Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits | Tong Li, Pravin Kamdar, Richard Daniel Kimmel | 2020-12-01 |
| 10762166 | Adaptive accelerated yield analysis | Pravin Kamdar, Tong Li, Richard Daniel Kimmel | 2020-09-01 |