Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10432140 | Method for testing a concentrated photovoltaic module | Remi Blanchard | 2019-10-01 |
| 10260868 | Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics | Mayeul Durand de Gevigney | 2019-04-16 |
| 10240977 | Method for 2D/3D inspection of an object such as a wafer | Gilles Fresquet, Alain Courteville | 2019-03-26 |