Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10514417 | IC degradation management circuit, system and method | Po-Zeng Kang, Chih-Hsien Chang, Yung-Chow Peng | 2019-12-24 |
| 10401407 | Output resistance testing integrated circuit | Po-Zeng Kang, Yung-Chow Peng | 2019-09-03 |
| 10281501 | Peak current evaluation system and peak current evaluation method | Yu-Tao Yang, Yung-Chow Peng | 2019-05-07 |
| 10274536 | Time to current converter | Yung-Chow Peng, Po-Zeng Kang, Yu-Tao Yang | 2019-04-30 |
| 10222412 | IC degradation management circuit, system and method | Po-Zeng Kang, Chih-Hsien Chang, Yung-Chow Peng | 2019-03-05 |