Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269666 | System and method for test key characterizing wafer processing state | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2019-04-23 |
WT
Wei-Chun Tsai
Overall (2019): #225,249 of 560,194Top 45%
1
Patents 2019