Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10330727 | Importance sampling method for multiple failure regions | Jing Wang, Woosung Choi | 2019-06-25 |
| 10204188 | Systems, methods and computer program products for analyzing performance of semiconductor devices | Jing Wang, Woosung Choi | 2019-02-12 |