Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10510623 | Overlay error and process window metrology | Shang-Wei Fang, Yuan-Yao Chang, Wei-Ray Lin, Ting-Hua Hsieh, Pei-Hsuan Lee +1 more | 2019-12-17 |
JW
Jing-Sen Wang
Overall (2019): #415,275 of 560,194Top 75%
1
Patents 2019