Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10472733 | Silicon single crystal manufacturing method | Ken Hamada | 2019-11-12 |
| 10261125 | Semiconductor wafer evaluation standard setting method, semiconductor wafer evaluation method, semiconductor wafer manufacturing process evaluation method, and semiconductor wafer manufacturing method | Takahiro NAGASAWA | 2019-04-16 |