Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10338269 | Method and X-ray inspection system, in particular for non-destructively inspecting objects | Sebastian König, Andreas Mader, Dirk Naumann, Jörg Nittikowski | 2019-07-02 |
| 10216866 | Image reconstruction based on parametric models | Matthias Muenster | 2019-02-26 |