Issued Patents 2019
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466185 | X-ray interrogation system using multiple x-ray beams | Sylvia Jia Yun Lewis, Janos Kirz | 2019-11-05 |
| 10416099 | Method of performing X-ray spectroscopy and X-ray absorption spectrometer system | Srivatsan Seshadri, Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon, Benjamin Donald Stripe | 2019-09-17 |
| 10401309 | X-ray techniques using structured illumination | Sylvia Jia Yun Lewis, Janos Kirz | 2019-09-03 |
| 10349908 | X-ray interferometric imaging system | Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon | 2019-07-16 |
| 10352880 | Method and apparatus for x-ray microscopy | Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri, Alan Francis Lyon, David Vine | 2019-07-16 |
| 10304580 | Talbot X-ray microscope | David Vine, Sylvia Jia Yun Lewis, Janos Kirz, Srivatsan Seshadri | 2019-05-28 |
| 10297359 | X-ray illumination system with multiple target microstructures | Sylvia Jia Yun Lewis, Janos Kirz, David Charles Reynolds, Alan Francis Lyon | 2019-05-21 |
| 10295486 | Detector for X-rays with high spatial and high spectral resolution | Sylvia Jia Yun Lewis, Janos Kirz, Benjamin Donald Stripe | 2019-05-21 |
| 10295485 | X-ray transmission spectrometer system | Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis | 2019-05-21 |
| 10269528 | Diverging X-ray sources using linear accumulation | Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon, David Charles Reynolds | 2019-04-23 |
| 10247683 | Material measurement techniques using multiple X-ray micro-beams | Sylvia Jia Yun Lewis, Janos Kirz | 2019-04-02 |