Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10481205 | Robust secure testing of integrated circuits | Jackson L. Ellis, Mark von Gnechten | 2019-11-19 |
| 10353001 | Rapid scan testing of integrated circuit chips | Nitin Satishchandra Kabra, Jay Shah | 2019-07-16 |