Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10210948 | Built-in self-test (BIST) circuit, memory device including the same, and method of operating the BIST circuit | Seung-ho Ok, Pyung-Moon Zhang, Sang Hoon Shin, Ki Hyun PARK | 2019-02-19 |