Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10198827 | Inspection method and system and a method of inspecting a semiconductor device using the same | Sangkyo Lim, Sunhee Shim, MiJung Jeon | 2019-02-05 |
WS
Woongkyu Son
Overall (2019): #220,955 of 560,194Top 40%
1
Patents 2019