Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10401301 | Optical test system and method, and method of manufacturing semiconductor device by using the optical test system and method | Akinori Okubo, Tae Hyun Kim, Sangwoo Bae, Janghwi Lee | 2019-09-03 |