Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10459348 | System and method of inspecting device under test, and method of manufacturing semiconductor device | Myung-Ho Jung, Ji Hoon Kang, Sung Won Park, Jae Min Lee | 2019-10-29 |
| 10429315 | Imaging apparatus and imaging method | Akio Ishikawa, Ken Ozawa, Kwang Soo Kim, Mitsunori Numata | 2019-10-01 |