Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10514392 | Probe card, test apparatus including the probe card, and related methods of manufacturing | Min-woo Rhee, Duke Kimm, Jae Hong Kim, In Kyu Park, Jun-Bo Yoon +4 more | 2019-12-24 |
| 10444270 | Systems for testing semiconductor packages | Jae Moo Choi, Jong-pill Park, Jae Hong Kim | 2019-10-15 |