Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429443 | Scan flip-flop and scan test circuit including the same | Ha-Young Kim, SUNG-WEE CHO, Jae Ha Lee | 2019-10-01 |
| 10192860 | Engineering change order (ECO) cell, layout thereof and integrated circuit including the ECO cell | Jae-Woo Seo | 2019-01-29 |