Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10373882 | Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same | Jihye Lee, Deokyong Kim, Soobok Chin | 2019-08-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10373882 | Method and system of measuring semiconductor device and method of fabricating semiconductor device using the same | Jihye Lee, Deokyong Kim, Soobok Chin | 2019-08-06 |