Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466179 | Semiconductor device inspection of metallic discontinuities | Gurvinder Singh, Wu Y. Han, John Thornell, Wayne Fitzgerald | 2019-11-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466179 | Semiconductor device inspection of metallic discontinuities | Gurvinder Singh, Wu Y. Han, John Thornell, Wayne Fitzgerald | 2019-11-05 |