Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10496505 | Integrated circuit test method | Wen-Hsuan Hsu, Cheng-Yan Wen, Chia-Tso Chao, Jih-Nung Lee | 2019-12-03 |
| 10416233 | Electronic apparatus and control method thereof | Chun-Yi Kuo, Jih-Nung Lee | 2019-09-17 |
| 10234503 | Debugging method executed via scan chain for scan test and related circuitry system | Chun-Yi Kuo, Jih-Nung Lee | 2019-03-19 |