Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509142 | Distributed analysis x-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2019-12-17 |
| 10422919 | X-ray inspection system that integrates manifest data with imaging/detection processing | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2019-09-24 |