| 10497457 |
DRAM retention test method for dynamic error correction |
Ely Tsern, Frederick A. Ware, Suresh Rajan |
2019-12-03 |
| 10388337 |
Memory with deferred fractional row activation |
James E. Harris, Frederick A. Ware, Ian Shaeffer |
2019-08-20 |
| 10378967 |
Dual temperature band integrated circuit device |
Frederick A. Ware |
2019-08-13 |
| 10362256 |
Fractional-readout oversampled image sensor |
Jay Endsley, Craig M. Smith, Michael Guidash, Alexander Schneider |
2019-07-23 |
| 10356350 |
Dark-emulation image sensor |
Michael Guidash, Jay Endsley, John Ladd, Craig M. Smith |
2019-07-16 |
| 10277843 |
Oversampled image sensor with conditional pixel readout |
Craig M. Smith, Michael Guidash, Jay Endsley, James E. Harris |
2019-04-30 |
| 10274652 |
Systems and methods for improving resolution in lensless imaging |
Jay Endsley |
2019-04-30 |
| 10269411 |
Memory controller and memory device command protocol |
Brent Haukness, Stephen Bowyer |
2019-04-23 |
| 10264195 |
Shared-counter image sensor |
— |
2019-04-16 |
| 10261584 |
Touchless user interface for handheld and wearable computers |
Patrick R. Gill, David G. Stork |
2019-04-16 |
| 10262750 |
Testing through-silicon-vias |
William N. Ng, Frederick A. Ware |
2019-04-16 |
| 10249660 |
Split-gate conditional-reset image sensor |
Michael Guidash |
2019-04-02 |
| 10248358 |
Memory component having internal read-modify-write operation |
Frederick A. Ware |
2019-04-02 |
| 10204662 |
Stacked DRAM device and method of manufacture |
— |
2019-02-12 |
| 10199098 |
2T-1R architecture for resistive RAM |
Deepak C. Sekar, Wayne F. Ellis, Brent Haukness, Gary B. Bronner |
2019-02-05 |
| 10199089 |
Reduced transport energy in a memory system |
Frederick A. Ware, John Eric Linstadt |
2019-02-05 |
| 10178329 |
Oversampled high dynamic-range image sensor |
Craig M. Smith |
2019-01-08 |