JL

Joseph C. LaPlaca

QI Quality Vision International: 2 patents #1 of 5Top 20%
🗺 New York: #2,767 of 13,137 inventorsTop 25%
Overall (2019): #156,910 of 560,194Top 30%
2
Patents 2019

Issued Patents 2019

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10401165 Articulated head with multiple sensors for measuring machine Edward T. Polidor, Kenneth L. Sheehan 2019-09-03
10222207 Articulated head with multiple sensors for measuring machine Edward T. Polidor, Kenneth L. Sheehan 2019-03-05