Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393675 | X-ray inspection apparatus | John Tingay, William T. Walker, Phil King, Simon White | 2019-08-27 |
| 10215716 | X-ray inspection apparatus for inspecting semiconductor wafers | John Tingay, William T. Walker | 2019-02-26 |