Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10339645 | Defect detection device and production system | Hirohisa Shibayama, Eiji Shiotani, Satoru Sakurai, Kiyokazu Sugiyama, Akira Shimizu +2 more | 2019-07-02 |
| 10247630 | Semiconductor device, mechanical quantity measuring device, and semiconductor device fabricating method | Hanae Shimokawa, Shosaku Ishihara, Atsuo SOMA, Junji Onozuka, Hiroshi Onuki +1 more | 2019-04-02 |