PB

Patrick Blankaert

NN Nikon Metrology Nv: 1 patents #1 of 21Top 5%
Overall (2019): #321,217 of 560,194Top 60%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10478147 Calibration apparatus and method for computed tomography Sam Hawker, Gemma Fardell 2019-11-19