HT

Hans Thielemans

NN Nikon Metrology Nv: 1 patents #1 of 21Top 5%
📍 Rotselaar, BE: #3 of 4 inventorsTop 75%
Overall (2019): #450,214 of 560,194Top 85%
1
Patents 2019

Issued Patents 2019

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10267629 Measurement probe unit for metrology applications Frank Thys, Raf Nysen, Laurens Van Horenbeek 2019-04-23