Issued Patents 2019
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10254214 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton, Alejandro S. Jaime +1 more | 2019-04-09 |