Issued Patents 2019
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10520301 | Method for measuring Z height values of a workpiece surface with a machine vision inspection system | — | 2019-12-31 |
| 10352679 | Compact coordinate measurement machine configuration with large working volume relative to size | — | 2019-07-16 |
| 10302466 | Contamination and defect resistant optical encoder configuration including first and second illumination source diffraction gratings arranged in first and second parallel planes for providing displacement signals | Norman Laman, Akihide Kimura, Shu Hirata | 2019-05-28 |
| 10295648 | Contamination and defect resistant optical encoder configuration including a normal of readhead plane at a non-zero pitch angle relative to measuring axis for providing displacement signals | Norman Laman, Akihide Kimura, Shu Hirata | 2019-05-21 |
| 10295378 | Contamination and defect resistant optical encoder configuration outputting structured illumination to a scale plane for providing displacement signals | Norman Laman, Akihide Kimura, Shu Hirata | 2019-05-21 |
| 10274344 | Displacement encoder | Akihide Kimura | 2019-04-30 |
| 10168189 | Contamination and defect resistant optical encoder configuration for providing displacement signal having a plurality of spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axis | Akihide Kimura, Shu Hirata | 2019-01-01 |